Sheet resistance and resistivity measurements of thin conducting semiconducting and superconducting films

J. Krupka

Warsaw University of Technology, Warsaw, Poland

Combined Scanning Microwave and Electron Microscopy: A Novel Toolbox for Hybrid Nanoscale Material Analysis

K. Haddadi^1,2, O. C. Haenssler^1,2,3, K. Daffe^1,2, S. Eliet^1,2, C. Boyaval^1,2, D. Theron^1,2, G. Dambrine^1,2

¹Univ. Lille, Lille, France, ²CNRS, Lille, France, ³University of Oldenburg, Oldenburg, Germany

One Resistor and Two Capacitors: An Electrical Engineer’s Simple View of a Biological Cell

X. M., X. Du, N. Gholizadeh, V. Gholizadeh, H. Li, X. Cheng, J. C. M. Hwang

Lehigh University, Bethlehem (PA), USA

Wideband extraction of soil dielectric spectrum from vector-network-analyzer measurements

A. Lewandowski^1,2, A. Szypłowska², M. Kafarski^2,3, A. Wilczek²

¹Warsaw University of Technology, Warsaw, Poland, ²Polish Academy of Sciences, Lublin, Poland, ³The State School of Higher Education in Chełm, Chełm, Poland

Broadband Interferometric Dielectric Spectroscopy for Aqueous Solutions

M. Zhang¹, X. Bao¹, T.Markovic¹, J. Bao¹, M. Chehelcheraghi¹, I. Ocket^2,1, B. Nauwelaers¹

¹ESAT-TELEMIC, KU Leuven, Heverlee, Belgium, ²Interuniversity Microelectronics Centre (IMEC), Heverlee, Belgium